The exceptional properties of 2D materials for important applications in semiconductors, battery technology, photovoltaics, and several other fields render them a key developing area of research. Various nanoscale and microscopy methods have been used to characterize 2D materials to gain better insights into the nature of their properties. NanoIR methods extend this characterization with crucial nanoscale chemical and optical property mapping.
The nanoIR3-s system offers two complementary nanoscale IR methods, AFM-IR photothermal-based nanoscale IR imaging and spectroscopy (including Tapping AFM-IR) and scattering-scanning near-field optical microscopy (s-SNOM). These methods offer an exceptional understanding of the nanoscale chemical and complex optical properties of 2D materials. Complementary atomic force microscopy (AFM) methods such as mechanical and thermal property mapping also offer information on the thermal, mechanical, and electrical properties of these materials. These methods allow chemical and optical property mapping with 10 nm spatial resolution, which is much less than the diffraction limit of traditional IR spectroscopy.
In this article, the application of the nanoIR3-s system for characterizing a range of 2D structures and materials, including nanoantennae, graphene, semiconductors, and more is explained.
Complementary Nanoscale IR Techniques
The nanoIR3-s is capable of acquiring nanoscale images and IR spectra using two different near-field spectroscopy methods: s-SNOM and photothermal AFM-IR. These complementary methods enable nanoscale chemical analysis, as well as electrical, thermal, mechanical, and optical mapping with spatial resolution down to a few nanometers for hard as well as soft matter applications.
Nanoscale IR spectroscopy integrates the exact chemical identification of infrared spectroscopy with the nanoscale capabilities of AFM to enable chemical detection of sample components at a chemical spatial resolution down to 10 nm with monolayer sensitivity, breaking the diffraction limit by greater than 100x. AFM-IR absorption spectra are direct measurements of sample absorption and are not dependent on other complicated optical properties of the sample and the tip. Therefore, the spectra compare extremely well to that of traditional bulk transmission IR.
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